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A GaAs MESFET 16*16 crosspoint switch at 1700 Mbits/sec

Authors :
Alessandro C. Callegari
S. Bermon
P.D. Hoh
P. Roche
J.D. Feder
Harold J. Hovel
J. H. Greiner
C.J. Anderson
M. Thomas
J.H. Magerlein
G.J. Scott
Andrew Pomerene
Source :
10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988..
Publication Year :
1988
Publisher :
IEEE, 1988.

Abstract

A GaAs MESFET 16x16 crosspoint switch has been fabricated on a 3-mm x 4-mm chip using a 1-μm super buffer logic (SBL) design containing approximately 10000 FETs and operating at 800 mW of power. A 99% confidence bit error rate (BER) better than 1*10/sup -3/ was obtained at 1.7 Gb/s rate using a 2/sup 7/ -1 pseudorandom NRZ (nonreturn-to-zero) sequence. The BER test was done on one path using a probe card. The chip has 255 out of 256 good crosspoints. The bad crosspoint was a repeating error from a mask defect. An advanced refractory-gate MESFET process was used to fabricate the chip. A lightly doped drain structure was used to reduce parasitic gate capacitance while maintaining acceptable source resistance, to reduce short-channel effects, to increase breakdown voltage compared to devices where the heavy source/drain implant is directly self-aligned to the gate edge. >

Details

Database :
OpenAIRE
Journal :
10th Annual IEEE (GaAs IC) Symposium, Gallium Arsenide Integrated Circuit. Technical Digest 1988.
Accession number :
edsair.doi...........c726f9fa11e663997017566aa5d15f5b
Full Text :
https://doi.org/10.1109/gaas.1988.11031