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Scalable embedded Ge-junction vertical-channel tunneling field-effect transistor for low-voltage operation

Authors :
Hyungcheol Shin
Hyun Woo Kim
Jong-Ho Lee
Min-Chul Sun
Byung-Gook Park
Garam Kim
Sangwan Kim
Source :
2010 IEEE Nanotechnology Materials and Devices Conference.
Publication Year :
2010
Publisher :
IEEE, 2010.

Abstract

While a tunneling field-effect transistor (TFET) is an attractive candidate for sub-20 nm ultra-low-power device, high I ON /I OFF and on-current are rarely reported with the deep-submicron structures. In this study, we propose a practical novel TFET structure with vertical channel and Ge junction, which shows high current ratio, low subthreshold swing and relatively high current even when the minimum device dimension is smaller than 20 nm. To find the optimum design, the off-state injection of a short-channel TFET and optimization of the source-side junction are studied by simulation.

Details

Database :
OpenAIRE
Journal :
2010 IEEE Nanotechnology Materials and Devices Conference
Accession number :
edsair.doi...........c704be79474913468cff6078736416de