Development of an Advanced Sample‐Scanning Stage System Prototype for an MLL‐Based Hard X‐ray Nanoprobe

The scientists and engineers at Argonne and Brookhaven are collaborating to develop a new nanopositioning system for the NSLS‐II Hard X‐ray Nanoprobe. In this paper we present the design and development of an advanced sample‐scanning stage system prototype for an MLL‐based hard x‐ray nanoprobe. The design and prototyping activities for the Brookhaven NSLS‐II nanopositioning system will also benefit the ongoing development of the Argonne CNM/APS MLL‐based hard x‐ray nanoprobe with hard x‐ray focusing in the nanometer scale.