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Silicon-Containing Additives in Encapsulation of Phase Change Materials for Thermal Energy Storage

Authors :
Johnathan Joo Cheng Lee
Natalie Jia Xin Lim
Pei Wang
Hongfei Liu
Suxi Wang
Chi-Lik Ken Lee
Dan Kai
Fengxia Wei
Rong Ji
Beng Hoon Tan
Shaozhong Ge
Ady Suwardi
Jianwei Xu
Xian Jun Loh
Qiang Zhu
Source :
World Scientific Annual Review of Functional Materials.
Publication Year :
2023
Publisher :
World Scientific Pub Co Pte Ltd, 2023.

Abstract

Microencapsulated phase change materials (MEPCMs) are effective solutions for addressing the issue of leakage that phase change materials (PCMs) face in thermal energy storage devices. Their applications are ubiquitous as PCMs are utilized in industries such as logistics, construction, electronics, etc., thus, an efficient method to prevent problems such as leakage and poor thermal conductivity is to encapsulate the PCM which not only renders it leakage-proof but also impart mechanical strength and enhanced thermal properties. The application of silicon-based additives is one of the most studied methods to impart such desired properties. We discuss the silicon-containing compounds which are commonly employed in core-shell matrix of encapsulated PCMs, namely, siloxanes and silicone, silicon nitride, silicon carbide, silica/SiO2, and other silicon-containing additives as they are able to provide synergistic improvements and exhibit enhanced physical properties. In this review, the different silicon compounds used as additives or main shell matrix are discussed, the general fabrication of the MEPCM and its thermophysical properties will be briefly highlighted. Lastly, we also examine its application and performance in thermal storage and thermal management. We hope to provide a broader perspective of silicon-containing MEPCM for those who are working in the similar field of research.

Details

ISSN :
28109236 and 28109228
Database :
OpenAIRE
Journal :
World Scientific Annual Review of Functional Materials
Accession number :
edsair.doi...........c31952611fa8e690ffb692a8d4aeed18
Full Text :
https://doi.org/10.1142/s2810922822300070