The Effect of Metal Composition on Bias Stability of Solution Processed Indium Oxide Based Thin Film Transistors

Authors :: Byeong-Soo Bae
Hyeon-Gyun Im
Hyungjin Park
Young Hwan Hwang
Yunyong Nam
Source :: ECS Journal of Solid State Science and Technology. 2:Q200-Q204
Publication Year :: 2013
Publisher :: The Electrochemical Society, 2013.

Subjects :: Materials science
Fabrication
business.industry
Oxide
chemistry.chemical_element
Electronic, Optical and Magnetic Materials
Solution processed
Metal
chemistry.chemical_compound
Semiconductor
chemistry
Thin-film transistor
visual_art
visual_art.visual_art_medium
Optoelectronics
Electronics
business
Indium

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