Investigation of the Influence of Buffer Layer on the Interface Roughness of NbC∕Si Multilayer

Authors :: Arijeet Das
S. K. Rai
A. Srivastava
R. Dhawan
G. S. Lodha
S. K. Deb
Alka B. Garg
R. Mittal
R. Mukhopadhyay
Source :: AIP Conference Proceedings.
Publication Year :: 2011
Publisher :: AIP, 2011.
Abstract: The influence of buffer layer on interface roughness has been investigated. With Si buffer layer, NbC/Si multilayer mirrors show 28% increase of reflectivity at 1st Bragg peak for 1.54A0. Reduction in physical and chemical roughness in the multilayer with buffer layer was calculated by fitting both specular and diffused scattering data.

Subjects :: Optics
Materials science
business.industry
Scattering
Bragg peak
Specular reflection
Surface finish
Composite material
business
Reflectivity
Layer (electronics)
Buffer (optical fiber)

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