Guidelines for E-beam Induced Current Studies of Defects in Perovskite Solar Cells

The poor stability of halide perovskites creates a barrier for common e-beam based microscopies. Thus, carefully optimized e-beam characterization conditions are needed before any meaningful measurement can be taken. In this study, we present a range of e-beam operating conditions for characterizing perovskite materials with minimal electronic damage by monitoring plan-view electron beam induced current (EBIC) of functional solar cell devices. We see a minimum of beam induced damage in plan-view operation the range of 7.5 to 9.5 kV at low currents (