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Automated simulation-generated EO/IR image library for artificial intelligence applications

Authors :
David C. Bell
Corey D. Packard
Mark D. Klein
Peter L. Rynes
Timothy S. Viola
Source :
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI.
Publication Year :
2020
Publisher :
SPIE, 2020.

Abstract

The emergence of machine learning into scientific fields has created opportunities for novel and powerful image processing techniques. Algorithms that can perform complex tasks without a “man-in-the-loop” or explicit instructions are invaluable artificial intelligence tools. These algorithms typically require a large set of training data on which to base statistical predictions. In the case of electro-optical infrared (EO/IR) remote sensing, algorithm designers often seek a substantial library of images comprising many weather conditions, times of day, sensor resolutions, etc. These images may be synthetic (predicted) or measured, but should encompass a large variety of targets imaged from a variety of vantage points against numerous backgrounds. Acquiring such a large set of measured imagery with sufficient variation can be difficult, requiring numerous field campaigns. Alternatively, accurate prediction of target signatures in cluttered outdoor scenes may be a viable option. In this work, sensor imagery is generated using CoTherm, a co-simulation tool which operates MuSES (an EO/IR simulation code) in an automated fashion to create a large library of synthetic images. The relevant MuSES inputs – which might include environmental factors, global location, date and time, vehicle engine state, human clothing and activity level, or sensor waveband – can be manipulated by a CoTherm workflow process. The output of this process is a large library of MuSES-generated EO/IR sensor radiance images suitable for algorithm development. If desired, synthetic target pixels can be inserted into measured background images for added realism.

Details

Database :
OpenAIRE
Journal :
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI
Accession number :
edsair.doi...........c103319b85ca4ee3e12e238a29da498f
Full Text :
https://doi.org/10.1117/12.2558843