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Implementation of optical interconnections for VLSI

Authors :
Sadik C. Esener
Sing H. Lee
W. H. Wu
Clark C. Guest
A.R. Johnston
Michael R. Feldman
L.A. Bergman
Paul K. L. Yu
Source :
IEEE Transactions on Electron Devices. 34:706-714
Publication Year :
1987
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1987.

Abstract

This paper reports on the progress in implementing optical interconnections for VLSI. Four areas are covered: 1) the holographic optical element (HOE), 2) the laser sources, 3) the detectors and associated circuits forming an optically addressed gate, and 4) interconnection experiments in which five gates are actuated from one source. A laser scanner system with a resolution of 12 µm × 20 µm has been utilized to generate the HOE's. Diffraction efficiency of the HOE and diffracted spot size have been measured. Stock lasers have been modified with a high-frequency package for interconnect experiments, and buried heterostructure fabrication techniques have been pursued. Measurements have been made on the fabricated photodetectors to determine dark current, responsivity and response time. The optical gates and the overall chip have been driven successfully with an input light beam, as well as with the optical signal interconnected through the one to five hologram.

Details

ISSN :
00189383
Volume :
34
Database :
OpenAIRE
Journal :
IEEE Transactions on Electron Devices
Accession number :
edsair.doi...........c0adffa8e275f5f8f4c8cf51ee1763d5
Full Text :
https://doi.org/10.1109/t-ed.1987.22983