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Dramatic switching behavior in suspended MoS2 field-effect transistors

Authors :
Peng Zhou
David Wei Zhang
Jingyu Li
Xiaozhang Chen
Huawei Chen
Source :
Semiconductor Science and Technology. 33:024001
Publication Year :
2018
Publisher :
IOP Publishing, 2018.

Abstract

When integrating MoS2 flakes into scaling-down transistors, the short-channel effect, which is severe in silicon technology below 5-nanometer, can be avoided effectively. MoS2 transistors not only exhibit a high on/off ratio but also demonstrate a rapid switching speed. According to the theoretical calculation, the thermionic limit subthreshold slope (SS) of the ideal device could reach 60 mV/dec. However, due to the confinement of defects from substrates or contamination during the process, the SS deteriorates to more than 300 mV/dec, causing serious power consumption. In this work, we optimize the SS through structure design of MoS2 transistors. The suspended transistors exhibit a high on/off ratio of 107 and a minimum SS of 63 mV/dec with an ultralow standby power at room temperature. This study demonstrates the promising potential of structure design for electronic devices with ultralow-power switching behaviors.

Details

ISSN :
13616641 and 02681242
Volume :
33
Database :
OpenAIRE
Journal :
Semiconductor Science and Technology
Accession number :
edsair.doi...........c02dab76ee3ab26f37d6eefdde2083e5
Full Text :
https://doi.org/10.1088/1361-6641/aaa222