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The Role of Mobility Degradation in the BTI-Induced RO Aging in a 28-nm Bulk CMOS Technology: (Student paper)
- Source :
- 2023 IEEE International Reliability Physics Symposium (IRPS).
- Publication Year :
- 2023
- Publisher :
- IEEE, 2023.
Details
- Database :
- OpenAIRE
- Journal :
- 2023 IEEE International Reliability Physics Symposium (IRPS)
- Accession number :
- edsair.doi...........bfaed66bda01f616f8497e4d591da6e8