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High-resolution valence band XPS studies of thin film Au–Al alloys

Authors :
H. Piao
N. S. McIntyre
Source :
Journal of Electron Spectroscopy and Related Phenomena. 119:29-33
Publication Year :
2001
Publisher :
Elsevier BV, 2001.

Abstract

The Maximum Entropy Method (MEM) has been used to deconvolute the valence-band XPS spectra of thin film Au–Al alloys. The enhanced resolution allows fine changes in the electronic structures of the thin film alloys to be distinguished with the aid of the Au4f core-level spectra. This particular alloy series allows one to examine the 5d electronic interaction between gold atoms as aluminum is gradually added to the matrix. Aluminum is shown to have a much stronger quenching effect on such interactions than has been found previously for copper.

Details

ISSN :
03682048
Volume :
119
Database :
OpenAIRE
Journal :
Journal of Electron Spectroscopy and Related Phenomena
Accession number :
edsair.doi...........bf7aed291affee7a9641a8a8e970cdb5
Full Text :
https://doi.org/10.1016/s0368-2048(01)00234-1