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High-resolution valence band XPS studies of thin film Au–Al alloys
- Source :
- Journal of Electron Spectroscopy and Related Phenomena. 119:29-33
- Publication Year :
- 2001
- Publisher :
- Elsevier BV, 2001.
-
Abstract
- The Maximum Entropy Method (MEM) has been used to deconvolute the valence-band XPS spectra of thin film Au–Al alloys. The enhanced resolution allows fine changes in the electronic structures of the thin film alloys to be distinguished with the aid of the Au4f core-level spectra. This particular alloy series allows one to examine the 5d electronic interaction between gold atoms as aluminum is gradually added to the matrix. Aluminum is shown to have a much stronger quenching effect on such interactions than has been found previously for copper.
- Subjects :
- Quenching
Radiation
Materials science
Alloy
Resolution (electron density)
Analytical chemistry
chemistry.chemical_element
engineering.material
Condensed Matter Physics
Copper
Atomic and Molecular Physics, and Optics
Spectral line
Electronic, Optical and Magnetic Materials
Condensed Matter::Materials Science
chemistry
X-ray photoelectron spectroscopy
Aluminium
engineering
Physical and Theoretical Chemistry
Thin film
Spectroscopy
Subjects
Details
- ISSN :
- 03682048
- Volume :
- 119
- Database :
- OpenAIRE
- Journal :
- Journal of Electron Spectroscopy and Related Phenomena
- Accession number :
- edsair.doi...........bf7aed291affee7a9641a8a8e970cdb5
- Full Text :
- https://doi.org/10.1016/s0368-2048(01)00234-1