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Source Localization by a Binary Sensor Network in the Presence of Imperfection, Noise, and Outliers

Authors :
Er-Wei Bai
Source :
IEEE Transactions on Automatic Control. 63:347-359
Publication Year :
2018
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 2018.

Abstract

In this paper, source localization by a network of primitive binary sensors under various imperfections are studied. Detailed analysis and mathematical modeling of imperfect binary sensors are presented. Imperfections include sensor failures of two types, drifting, uncertainty, and heterogeneity in binary sensor trigger thresholds, presence of noise, and nonradial symmetry of sensing ranges. Theoretical results, including asymptotical convergence, are established, in particular in the presence of substantial outliers due to sensor failure and large noise. Efficient numerical algorithms are proposed and simulated supporting the theoretical analysis.

Details

ISSN :
15582523 and 00189286
Volume :
63
Database :
OpenAIRE
Journal :
IEEE Transactions on Automatic Control
Accession number :
edsair.doi...........bf48c7dab47f78d66113ae18763999db
Full Text :
https://doi.org/10.1109/tac.2017.2713049