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A technique for calculation of shell thicknesses for core-shell-shell nanoparticles from XPS data
- Source :
- Surface and Interface Analysis. 48:274-282
- Publication Year :
- 2016
- Publisher :
- Wiley, 2016.
-
Abstract
- This paper extends a straightforward technique for the calculation of shell thicknesses in core-shell nanoparticles to the case of core-shell-shell nanoparticles using X-ray Photoelectron Spectroscopy (XPS) data. This method can be applied by XPS analysts and does not require any numerical simulation or advanced knowledge, although iteration is required in the case where both shell thicknesses are unknown. The standard deviation in the calculated thicknesses vs simulated values is typically less than 10%, which is the uncertainty of the electron attenuation lengths used in XPS analysis.
- Subjects :
- Materials science
Computer simulation
Attenuation
Nuclear Theory
Analytical chemistry
Shell (structure)
Nanoparticle
02 engineering and technology
Surfaces and Interfaces
General Chemistry
Electron
010402 general chemistry
021001 nanoscience & nanotechnology
Condensed Matter Physics
01 natural sciences
Molecular physics
Standard deviation
0104 chemical sciences
Surfaces, Coatings and Films
Core shell
X-ray photoelectron spectroscopy
Physics::Atomic and Molecular Clusters
Materials Chemistry
0210 nano-technology
Subjects
Details
- ISSN :
- 01422421
- Volume :
- 48
- Database :
- OpenAIRE
- Journal :
- Surface and Interface Analysis
- Accession number :
- edsair.doi...........be6a596bf3795ec9eafc15760d08a46b