Piezospectroscopic analysis of the Pt–H2 complex in silicon

In this study the use of the high-resolution Laplace DLTS combined with uniaxial stress has allowed us to investigate in detail the structure and electrical properties of the platinum–hydrogen-related complex PtH 2 . We correlate the defect electronic level with the results of other spectroscopic studies performed with electron paramagnetic resonance and far-infrared absorption measurements. The observed stress-induced peak splitting pattern confirms the orthorhombic-IC 2v symmetry of the complex. The re-orientation process of the defect can be observed at temperatures higher than the room temperature for all bias conditions.