Test input generation for supply current testing of bridging faults in bipolar combinational logic circuits

A test input generation algorithm for supply current tests is proposed to detect bridging faults in bipolar combinational circuits. By using the algorithm, test input vectors are derived for ISCAS-85 benchmark circuits, which are implemented on printed boards. It is shown by the test generation that more faults in bipolar circuits can be detected with a smaller number of test input vectors than a conventional test method based on output logic values.