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Ultrathin Aluminum Oxide Films Induced by Rapid Thermal Annealing for Effective Silicon Surface Passivation
- Source :
- physica status solidi (RRL) – Rapid Research Letters. 15:2100267
- Publication Year :
- 2021
- Publisher :
- Wiley, 2021.
Details
- ISSN :
- 18626270 and 18626254
- Volume :
- 15
- Database :
- OpenAIRE
- Journal :
- physica status solidi (RRL) – Rapid Research Letters
- Accession number :
- edsair.doi...........bcf6b28243831e78171f31613eac2099
- Full Text :
- https://doi.org/10.1002/pssr.202100267