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Fast and Accurate Deep Neural Network (DNN) Model Extension Method for Signal Integrity (SI) Applications

Authors :
Taein Shin
Seungtaek Jeong
Daehwan Lho
Seongguk Kim
Subin Kim
Joungho Kim
Junyong Park
HyunWook Park
Kyungjune Son
Gapyeol Park
Boogyo Sim
Hyungmin Kang
Source :
2019 Electrical Design of Advanced Packaging and Systems (EDAPS).
Publication Year :
2019
Publisher :
IEEE, 2019.

Abstract

In this paper, we first propose a fast and accurate deep neural network (DNN) model extension method for signal integrity (SI) applications. Reusing pre-trained weights of DNN model, the model can be extended when new training data are given. Instead of updating whole weights of DNN in traditional machine learning (ML) approaches, fine-tuning of a part of weights can accelerate training. For verification, we applied the proposed method to regression model of peak time domain reflectometry (TDR) impedance of through hole via (THV) and classification model of through silicon via (TSV) void defects. Training time of the proposed method were 0.3 s and 2.3 s respectively, which are 99 % and 82.3 % reduction compared to the traditional approach. Moreover, test accuracy of the proposed method achieved 99.2 % and 100 %, respectively.

Details

Database :
OpenAIRE
Journal :
2019 Electrical Design of Advanced Packaging and Systems (EDAPS)
Accession number :
edsair.doi...........bc8ea8df5ab902e9b11a7f316967f9f1
Full Text :
https://doi.org/10.1109/edaps47854.2019.9011677