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Investigations of adhesion between Cu and Benzocyclobutene (BCB) polymer dielectric for 3D integration applications

Authors :
Kuan-Neng Chen
Cheng-Ta Ko
S. H. Hu
W. C. Huang
Jihperng Leu
Source :
2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT).
Publication Year :
2011
Publisher :
IEEE, 2011.

Abstract

In this paper, the adhesion strength between Cu metal and Benzocyclobutene (BCB) polymer dielectric was investigated and reported. The relation between the adhesion strength and thickness of metal layer and the relation between the adhesion strength and stacking order of copper and BCB polymer layer are discussed as well. Finally, the concept of an extra layer between Cu metal and BCB polymer layer to improve the adhesion strength was evaluated. The results of this research can provide important guidelines of hybrid bonding and underfill for 3D integration applications.

Details

Database :
OpenAIRE
Journal :
2011 6th International Microsystems, Packaging, Assembly and Circuits Technology Conference (IMPACT)
Accession number :
edsair.doi...........bc7319bcfcf09a7082435d2776513814
Full Text :
https://doi.org/10.1109/impact.2011.6117239