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Controlled dose-modulated ion implantation on serial implanters

Authors :
Yasuhiko Kimura
Tetsuya Kudo
F. Sato
R. Toda
Akihiro Ochi
Kazuyoshi Ueno
Genshu Fuse
M. Tsukihara
Shiro Ninomiya
Michiro Sugitani
Source :
Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08).
Publication Year :
2008
Publisher :
IEEE, 2008.

Abstract

In order to compensate the variation from other processes, an intentional non-uniform dosage mapping system has been developed. Modulating both vertical and horizontal scan speed makes it possible to implant in two-dimensional non-uniform dosage even for high-tilt implantation. For zero-degree angle implantation, more complicated non-uniform dosage mapping can be achieved by combining the scan control with step-wise rotations.

Details

Database :
OpenAIRE
Journal :
Extended Abstracts - 2008 8th International Workshop on Junction Technology (IWJT '08)
Accession number :
edsair.doi...........bb7c3ceaae7b235dfbd0f8c7f12f5df0