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Low-Voltage SEM

Authors :
Charles E. Lyman
Joseph I. Goldstein
Alton D. Romig
Patrick Echlin
David C. Joy
Dale E. Newbury
David B. Williams
John T. Armstrong
Charles E. Fiori
Eric Lifshin
Klaus-Ruediger Peters
Source :
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy ISBN: 9780306435911
Publication Year :
1990
Publisher :
Springer US, 1990.

Details

ISBN :
978-0-306-43591-1
ISBNs :
9780306435911
Database :
OpenAIRE
Journal :
Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy ISBN: 9780306435911
Accession number :
edsair.doi...........bb406b9f5ebbf08133ad105010c8d60d
Full Text :
https://doi.org/10.1007/978-1-4613-0635-1_10