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Two-wavelength phase shift interferometry to characterize ballistic features

Authors :
Christopher J. Mann
Glenn W. Pagano
Source :
SPIE Proceedings.
Publication Year :
2014
Publisher :
SPIE, 2014.

Abstract

We apply two-wavelength phase shifting interferometry to generate 3D surface profile maps of spent bullet cartridge cases. From the captured interferograms, an optimized algorithm was used to calculate a phase profile from which a precise digital surface map of the cartridge casing may be produced. This 3D surface profile is used to enhance a firearms examiner's ability to uniquely identify distinct features or toolmarks imprinted on the casing when the weapon is fired. These features play a key role in the matching process of ballistic forensic examination.

Details

ISSN :
0277786X
Database :
OpenAIRE
Journal :
SPIE Proceedings
Accession number :
edsair.doi...........bb3aae12d17bd14de32f8a2af8c991f8