Back to Search
Start Over
Hierarchical Test Integration Methodology for 3-D ICs
- Source :
- IEEE Design & Test. 32:59-70
- Publication Year :
- 2015
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2015.
-
Abstract
- In this paper, we propose a hierarchical test integration method for 3-D ICs. The method can handle a die with logic cores and memory cores. In addition to handle the test controlling of a hierarchical 3-D IC, furthermore, it also can support the test controlling of a 3-D IC with multiple towers. For a 3-D IC, the hierarchical test integration method uses two types of 1149.1-based test interfaces for the bottom die and nonbottom dies. Therefore, the test access ports for the two test interfaces are the same. Also, the number of required test pads of the proposed test interface is only 4. Furthermore, the test interface is compatible with the IEEE 1149.1 standard for the board-level testing.
- Subjects :
- Engineering
business.product_category
business.industry
Interface (computing)
Integrated circuit
law.invention
Test (assessment)
Automatic test equipment
Hierarchical test
Built-in self-test
Hardware and Architecture
law
Embedded system
Die (manufacturing)
Electrical and Electronic Engineering
business
Software
Subjects
Details
- ISSN :
- 21682364 and 21682356
- Volume :
- 32
- Database :
- OpenAIRE
- Journal :
- IEEE Design & Test
- Accession number :
- edsair.doi...........b899d866b39cdb6f38fa2e5b7a86cf51