Dual-Attention Generative Adversarial Networks for Fault Diagnosis Under the Class-Imbalanced Conditions

Authors :: Weihua Li
Shaohui Zhang
Rugen Wang
Zhuyun Chen
Source :: IEEE Sensors Journal. 22:1474-1485
Publication Year :: 2022
Publisher :: Institute of Electrical and Electronics Engineers (IEEE), 2022.

Subjects :: Class (computer programming)
Adversarial system
Computer science
business.industry
Artificial intelligence
Electrical and Electronic Engineering
DUAL (cognitive architecture)
Fault (power engineering)
business
Instrumentation
Generative grammar

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