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Machine vision system for alignment in die-to-wafer bonder

Authors :
Jiyoung Chu
Minhwan Seo
Hyungjin Kim
Wondon Joo
Sungmin Ahn
Sangwoo Bae
Source :
Optical System Alignment, Tolerancing, and Verification XIV.
Publication Year :
2022
Publisher :
SPIE, 2022.

Details

Database :
OpenAIRE
Journal :
Optical System Alignment, Tolerancing, and Verification XIV
Accession number :
edsair.doi...........b7b4a23c1bfd25e5081360f6fe96fe43
Full Text :
https://doi.org/10.1117/12.2633000