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Enhancement of contrast ratio in pattern edge extraction by using voltage-controlled negative load resistors

Authors :
K. Mitsunaga
Keisuke Kojima
K. Hara
Kazuo Kyuma
Source :
IEEE Photonics Technology Letters. 3:852-855
Publication Year :
1991
Publisher :
Institute of Electrical and Electronics Engineers (IEEE), 1991.

Abstract

Parallel-connected pn-pn optical switches can be used to realize pattern edge extraction. The authors describe a method of enhancing the on-edge/off-edge contrast ratio using voltage-controlled negative load resistors. Negative resistance can suppress the currents injected into the off-edge elements. In an experiment with the negative resistors based on serial-connected thyristors, a contrast ratio as high as 16:1 was obtained. >

Details

ISSN :
19410174 and 10411135
Volume :
3
Database :
OpenAIRE
Journal :
IEEE Photonics Technology Letters
Accession number :
edsair.doi...........b7b2c5bdeba0910c5b9ed6ab8d33593e