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Thickness and temperature dependency of variation of dielectric functions of phase-change VO2 film
- Source :
- 2018 23rd Opto-Electronics and Communications Conference (OECC).
- Publication Year :
- 2018
- Publisher :
- IEEE, 2018.
-
Abstract
- In this paper, temperature- and thickness-dependent variation of dielectric functions of VO 2 film deposited by pulsed-laser deposition is characterized at both insulating and metallic phases by ellipsometry.
- Subjects :
- Materials science
Physics::Optics
02 engineering and technology
Dielectric
Optical refraction
021001 nanoscience & nanotechnology
01 natural sciences
Temperature measurement
010309 optics
Metal
Condensed Matter::Materials Science
Phase change
Ellipsometry
visual_art
0103 physical sciences
visual_art.visual_art_medium
Condensed Matter::Strongly Correlated Electrons
Composite material
0210 nano-technology
Deposition (law)
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2018 23rd Opto-Electronics and Communications Conference (OECC)
- Accession number :
- edsair.doi...........b6ee06916111892377aebcb2fa0dbbfb
- Full Text :
- https://doi.org/10.1109/oecc.2018.8729867