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A generic tolerance analysis model with illustrations for TAB bonding

Authors :
S. Natarajan
K. Banerjee
J. Wittrock
B. Connor
Source :
Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium.
Publication Year :
2002
Publisher :
IEEE, 2002.

Abstract

From first principles a generic model which can be applied to a variety of problems associated with placement errors, which are not limited to overlapping features alone is generated. The same model with minor changes is used to predict what the tolerances on a die and bond stage should be, such that the die edge does not interfere with the edges of the cavity of the bond stage when it is placed in the stage. The model is verified with actual data, and proves to be quite accurate. >

Details

Database :
OpenAIRE
Journal :
Proceedings of 15th IEEE/CHMT International Electronic Manufacturing Technology Symposium
Accession number :
edsair.doi...........b5c943289642f1dfd7332f9e3cf5a35a
Full Text :
https://doi.org/10.1109/iemt.1993.398180