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About complex refractive index of black Si

Authors :
Milan Mikula
Hikaru Kobayashi
Emil Pinčík
Róbert Brunner
Source :
Journal of Electrical Engineering. 68:81-83
Publication Year :
2017
Publisher :
Walter de Gruyter GmbH, 2017.

Abstract

The paper deals with the complex refractive index in the IR light region of two types of samples (i) as prepared black silicon, and (ii) thermally oxidized black silicon (BSi) nano-crystalline specimens produced both by the surface structure chemical transfer method using catalytic Ag evaporated spots (as prepared sample) and by the catalytic Pt catalytic mesh (thermally oxidized sample). We present, compare, and discuss the values of the IR complex refractive index obtained by calculation using the Kramers-Krönig transformation. Results indicate that small differences between optical properties of as prepared black Si and thermally oxidized BSi are given by: (i) – oxidation procedure, (ii) – thickness of the formed black Si layer, mainly, not by utilization of different catalytic metals, and by iii) the different thickness. Contamination of the surface by different catalytic metals contributes almost equally to the calculated values of the corresponding complex refractive index.

Details

ISSN :
1339309X
Volume :
68
Database :
OpenAIRE
Journal :
Journal of Electrical Engineering
Accession number :
edsair.doi...........b39d2cfe1da2b4d6529f71a855a94fa6