Back to Search Start Over

Ion microbeam tomography

Authors :
A. A. Ver Berkmoes
Arlyn J. Antolak
D.W. Heikkinen
J.M. Brase
Harry E. Martz
I.D. Proctor
D.H. Morse
A.E. Pontau
Source :
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :646-650
Publication Year :
1989
Publisher :
Elsevier BV, 1989.

Abstract

Proton beams with energies of 5 and 7 MeV are focused to 5 μm and used to produce tomograms of capillary tubes and low-density foams. In this energy range, proton energy loss is primarily due to interactions with electrons. Therefore, by measuring the residual energy of protons transmitted through samples in a manner similar to that used for Scanning Transmission Ion Microscopy (STIM), and reconstructing a cross-sectional image from multiple projections, we can map out spatial variations in electron density due to sample geometry and composition. In our experimental arrangement, the sample is translated and rotated in a stationary proton beam. Transmitted proton energies are measured using a silicon surface barrier detector. Tomographie reconstructions are produced from the calculated line-average densities using a procedure based on a filtered backprojection algorithm developed for X-ray computed tomography (CT) systems. The technique is especially useful in characterizing samples where large variations in Z or low total density limit the applicability of X-ray CT analysis.

Details

ISSN :
0168583X
Database :
OpenAIRE
Journal :
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
Accession number :
edsair.doi...........b36dfc784147b2963df162c70cc47b43