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Direct Electron Detection for Atomic Resolution in situ EELS

Authors :
Lena F. Kourkoutis
David J. Baek
Berit H. Goodge
Source :
Microscopy and Microanalysis. 24:1844-1845
Publication Year :
2018
Publisher :
Oxford University Press (OUP), 2018.

Subjects

Subjects :
010302 applied physics
In situ
Materials science
Atomic resolution
0103 physical sciences
Analytical chemistry
02 engineering and technology
Electron
021001 nanoscience & nanotechnology
0210 nano-technology
01 natural sciences
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
24
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........b3460950c63a98797fd0fbf0d3e97c0c

Tools

Authors Abstract Subjects Details