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First in-beam application of thallium bromide semiconductor detectors to particle-induced X-ray emission
- Source :
- International Journal of PIXE. 29:53-59
- Publication Year :
- 2019
- Publisher :
- World Scientific Pub Co Pte Lt, 2019.
-
Abstract
- For the first time, particle-induced X-ray emission (PIXE) spectra were obtained using TlBr detectors. The TlBr detector was fabricated from a crystal grown with material purified by the zone purification. Its active volume was 1.5 mm × 1.5 mm × 3.1 mm, and it exhibited an energy resolution of a 6.2 keV full-width at half-maximum (FWHM) for 59.5 keV at room temperature. The detector was installed into a PIXE system at Aomori Prefecture Quantum Science Center. A Pb plate target in the PIXE chamber was irradiated with a 20 MeV proton beam, and X-ray peaks for Pb K[Formula: see text] and K[Formula: see text] were successfully detected by the TlBr detector at room temperature.
Details
- ISSN :
- 17936616 and 01290835
- Volume :
- 29
- Database :
- OpenAIRE
- Journal :
- International Journal of PIXE
- Accession number :
- edsair.doi...........b226adf3cc85d0fee3b3f6b433ccb06a