Elliptical‐polarization measurements in the vacuum ultraviolet and soft x‐ray regions with a reflection polarimeter

A complete polarization analysis has been successfully achieved for synchrotron radiation beams in the vacuum ultraviolet and soft x‐ray regions using a reflection polarimeter. The Stokes parameters, which provide a full description of the polarization state of light, were experimentally determined along with three polarizing quantities of the polarimeter. The present result indicates the possibility of a simultaneous determination of the optical constants of mirror materials through polarization analyses.