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Performance of a Nano-CNC Machined 220-GHz Traveling Wave Tube Amplifier
- Source :
- IEEE Transactions on Electron Devices. 64:2390-2397
- Publication Year :
- 2017
- Publisher :
- Institute of Electrical and Electronics Engineers (IEEE), 2017.
-
Abstract
- We report on hot test measurements of a wide-bandwidth, 220-GHz sheet beam traveling wave tube amplifier developed under the Defense advanced research projects agency (DARPA) HiFIVE program. Nano-computer numerical control (CNC) milling techniques were employed for the precision fabrication of double vane, half-period staggered interaction structures achieving submicrometer tolerances and nanoscale surface roughness. A multilayer diffusion bonding technique was implemented to complete the structure demonstrating wide bandwidth (>50 GHz) with an insertion loss of about −5 dB achieved during transmission measurements of the circuit. The sheet beam electron gun utilized nanocomposite scandate tungsten cathodes that provided over 438-A/cm2 current density in the 12.5:1 ratio sheet beam. An InP HBT-based monolithic microwave integrated circuit preamplifier was employed for TWT gain measurements in the stable amplifier operation region. In the wide-bandwidth operation mode (for gun voltage of 20.9 kV), a gain of over 24 dB was measured over the frequency range of 207–221 GHz. In the high-gain operation mode (for gun voltage of 21.8 kV), over 30 dB of gain was measured over the frequency range of 197–202 GHz. High-power tests were conducted employing an extended interaction klystron.
- Subjects :
- 010302 applied physics
Engineering
Klystron
Preamplifier
business.industry
Heterojunction bipolar transistor
Amplifier
Electrical engineering
Traveling-wave tube
01 natural sciences
010305 fluids & plasmas
Electronic, Optical and Magnetic Materials
law.invention
law
0103 physical sciences
Optoelectronics
Insertion loss
Electrical and Electronic Engineering
business
Monolithic microwave integrated circuit
Voltage
Subjects
Details
- ISSN :
- 15579646 and 00189383
- Volume :
- 64
- Database :
- OpenAIRE
- Journal :
- IEEE Transactions on Electron Devices
- Accession number :
- edsair.doi...........b128157049d0b59342e8abc02c1ff1c4
- Full Text :
- https://doi.org/10.1109/ted.2017.2682159