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Fully Statistical, Wavelet-based conditional random field (FSWCRF) for SAR image segmentation
- Source :
- Expert Systems with Applications. 168:114370
- Publication Year :
- 2021
- Publisher :
- Elsevier BV, 2021.
-
Abstract
- Recently, the conditional random field (CRF) model has been greatly considered in synthetic aperture radar (SAR) image segmentation. This model not only directly considers the posterior distribution of the label field conditioned on images but also gives the interactions between the observations. In this paper, we propose a new CRF-based algorithm for SAR image segmentation. We consider the statistical approach jointly in feature extraction and similarity measurement in the proposed conditional random field model. Using the benefit of the 2-D wavelet transform, we define the generalized Gaussian distribution (GGD) on the wavelet coefficients to extract texture-based features. Then, to improve the CRF potential functions a new unary function is proposed which exactly matches the statistical properties of the wavelet coefficients and produces more accurate parameters for different regions. As the advantage of this function, it is no longer necessary to apply the multinomial logistic regression (MLR) model used in previous CRFs. Moreover, using the Kullback–Leibler distance (KLD) between distribution functions, the similarity measure in our pairwise potential is proposed very effectively and efficiently. The superiority of this scheme is that the similarity measure can be entirely computed using the parameters of the GGD that are typically of small size compared with the feature vectors in the previous methods. Comprehensive experiments on both synthetic and real SAR images indicate that our proposed algorithm achieves accuracy improvement in SAR image segmentation.
- Subjects :
- Conditional random field
Synthetic aperture radar
0209 industrial biotechnology
Computer science
business.industry
Feature vector
Feature extraction
Posterior probability
ComputingMethodologies_IMAGEPROCESSINGANDCOMPUTERVISION
General Engineering
Wavelet transform
Pattern recognition
02 engineering and technology
Image segmentation
Similarity measure
Computer Science Applications
ComputingMethodologies_PATTERNRECOGNITION
020901 industrial engineering & automation
Wavelet
Distribution function
Artificial Intelligence
0202 electrical engineering, electronic engineering, information engineering
020201 artificial intelligence & image processing
Artificial intelligence
business
Subjects
Details
- ISSN :
- 09574174
- Volume :
- 168
- Database :
- OpenAIRE
- Journal :
- Expert Systems with Applications
- Accession number :
- edsair.doi...........b0fd7aa8b8677c6344847e198df7cedf