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Achieving uniform layer deposition by atmospheric-pressure plasma-enhanced chemical vapor deposition
- Source :
- Thin Solid Films. 597:7-13
- Publication Year :
- 2015
- Publisher :
- Elsevier BV, 2015.
-
Abstract
- This work investigates the use of plasma-enhanced chemical vapor deposition under atmospheric pressure for achieving uniform layer formation. Electrical and optical measurements demonstrated that the counterbalance between oxygen and precursors maintained the homogeneous discharge mode, while creating intermediate species for layer deposition. Several steps of the deposition process of the layers, which were processed on a stationary stage, were affected by flow stream and precursor depletion. This study showed that by changing the flow streamlines using substrate stage motion uniform layer deposition under atmospheric pressure can be achieved.
- Subjects :
- Hybrid physical-chemical vapor deposition
Chemistry
Ion plating
Metals and Alloys
Analytical chemistry
Surfaces and Interfaces
Combustion chemical vapor deposition
Surfaces, Coatings and Films
Electronic, Optical and Magnetic Materials
Chemical engineering
Plasma-enhanced chemical vapor deposition
Materials Chemistry
Deposition (phase transition)
Thin film
Layer (electronics)
Plasma processing
Subjects
Details
- ISSN :
- 00406090
- Volume :
- 597
- Database :
- OpenAIRE
- Journal :
- Thin Solid Films
- Accession number :
- edsair.doi...........b0a752311a447fba83dbacc6db558701
- Full Text :
- https://doi.org/10.1016/j.tsf.2015.11.015