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Nanolayer Characterisation by Reference-free X-ray Fluorescence Analysis with Synchrotron Radiation

Authors :
Michael Kolbe
Burkhard Beckhoff
Michael Krumrey
Michael A. Reading
Jaap Van den Berg
Thierry Conard
Stefan De Gendt
Source :
ECS Meeting Abstracts. :1975-1975
Publication Year :
2009
Publisher :
The Electrochemical Society, 2009.

Abstract

not Available.

Details

ISSN :
21512043
Database :
OpenAIRE
Journal :
ECS Meeting Abstracts
Accession number :
edsair.doi...........b058873b4dde80691d7ff5899c477815

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