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A Method of Background Subtraction for the Analysis of Broadened Profiles

Authors :
S. Enzo
W. Parrish
Source :
Advances in X-Ray Analysis ISBN: 9781461297130
Publication Year :
1984
Publisher :
Springer US, 1984.

Details

ISBN :
978-1-4612-9713-0
ISBNs :
9781461297130
Database :
OpenAIRE
Journal :
Advances in X-Ray Analysis ISBN: 9781461297130
Accession number :
edsair.doi...........b00a2f3cfa03a6f97b05e7b044f4f959
Full Text :
https://doi.org/10.1007/978-1-4613-2775-2_7