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Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata

Authors :
Craig S. Lent
Mo Liu
Source :
Journal of Electronic Testing. 23:211-218
Publication Year :
2007
Publisher :
Springer Science and Business Media LLC, 2007.

Abstract

The computational paradigm known as quantum-dot cellular automata (QCA) encodes binary information in the charge configuration of Coulomb-coupled quantum-dot cells. Functioning QCA devices made of metal-dot cells have been fabricated and measured. We focus here on the issue of robustness in the presence of disorder and thermal fluctuations. We examine the performance of a semi-infinite QCA shift register as a function of both clock period and temperature. The existence of power gain in QCA cells acts to restore signal levels even in situations where high speed operation and high temperature operation threaten signal stability. Random variations in capacitance values can also be tolerated.

Details

ISSN :
15730727 and 09238174
Volume :
23
Database :
OpenAIRE
Journal :
Journal of Electronic Testing
Accession number :
edsair.doi...........af576ff29f4fd3bd0952c4f7d28be12b
Full Text :
https://doi.org/10.1007/s10836-006-0627-8