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Dependence of solar cell contact resistivity measurements on sample preparation methods
- Source :
- 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC).
- Publication Year :
- 2016
- Publisher :
- IEEE, 2016.
-
Abstract
- The measurement of contact resistivity between the grid metallization of a solar cell and the underlying silicon wafer is most conveniently performed by cutting strips from solar cells rather than fabricating dedicated structures with variable spaced contacts. We studied the effect of strip width on the measurements and found the lowest values in the range of 10–15 mm. We found laser scribing conditions whereby strips could be successfully isolated on the emitter side without snapping strips from the rest of the cell.
- Subjects :
- Materials science
business.industry
Electrical engineering
02 engineering and technology
STRIPS
010402 general chemistry
021001 nanoscience & nanotechnology
01 natural sciences
0104 chemical sciences
law.invention
law
Electrical resistivity and conductivity
Solar cell
Optoelectronics
Wafer
Sample preparation
0210 nano-technology
business
Laser scribing
Common emitter
Subjects
Details
- Database :
- OpenAIRE
- Journal :
- 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC)
- Accession number :
- edsair.doi...........aee7fb5a9d1df30302e75fbf44b025a1