Coherent X-ray Diffraction Imaging of Zeolite Microcrystals (abstract)

We measured coherent x‐ray diffraction (CXD), an emerging technique to obtain three‐dimensional internal and external images of crystals, on ZSM‐5 zeolite microcrystals to get internal density distribution and to map deformation field of strain. The experiments were performed at the beamline 34‐ID‐C in Advanced Photon Source at Argonne National Laboratory in the US. The CXD patterns of ZSM‐5 zeolite microcrystals with sizes of 2 μm by monochromatic coherent x‐rays with energy of 9 keV were obtained under continuously surrounding and Bragg conditions as a function of temperature. The oversampled diffraction patterns are inverted to obtain three‐dimensional images of the shapes and internal strain fields of zeolite microcrystals using phase retrieval algorithms of error reduction and a hybrid input‐output method. The internal density and strain distribution as a function of temperature are discussed.