In-situ Correlative Analysis of electrical and magnetic properties of Ion-beam treated surfaces by combination of AFM and FIB

Authors :: Peter Hosemann
Robert Winkler
Georg E. Fantner
Johanna Hütner
Chistian Schwalb
Hajo Frerichs
Harald Plank
Gregor Hlawacek
Santiago H. Andany
Marion Wolff
Source :: Microscopy and Microanalysis. 27:1020-1020
Publication Year :: 2021
Publisher :: Oxford University Press (OUP), 2021.

Subjects :: Correlative
In situ
Materials science
Ion beam
business.industry
Atomic force microscopy
Optoelectronics
business
Instrumentation

Tools