Physical properties of a new flat panel detector with irradiated side sampling (ISS) technology

Flat panel detectors have become the standard technology in projection radiography. Further progress in detector technology will result in an improvement of MTF and DQE. The new detector (FDR D-Evo plus C24i, Fuji, Japan) is based on cesium-iodine crystals and has a change in the detector layout. The read-out electrodes are moved to the irradiated side of the detector. The physical properties of the detector were determined following IEC 62220-1-1 as close as possible. The MTF showed a significant improvement compared to other cesium-iodine based flat-panel detectors. Thereby the DQE is improved to other cesium-iodine based detectors especially for the higher frequencies. The average distance between the point of interaction of the x-rays in the detector and the light collector is shorter, due to the exponential absorption law in the detector. Thereby there is a reduction in light scatter and light absorption in the cesium-iodine needle crystals. This might explain the improvement of the MTF and DQE results in our measurements. The new detector design results in an improvement in the physical properties of flat-panel detectors. This enables a potential for further dose reductions in clinical imaging.