Back to Search
Start Over
STEM Strain Measurement From a Stream of Diffraction Patterns Recorded on a Pixel-Free Delay-Line Detector
- Source :
- Microscopy and Microanalysis. 22:520-521
- Publication Year :
- 2016
- Publisher :
- Oxford University Press (OUP), 2016.
- Subjects :
- 0301 basic medicine
Diffraction
Materials science
Pixel
business.industry
Detector
Strain measurement
02 engineering and technology
021001 nanoscience & nanotechnology
03 medical and health sciences
030104 developmental biology
Optics
Line (text file)
0210 nano-technology
business
Instrumentation
Subjects
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 22
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........ae34c09801085a9d3ae4b0e615847ab0