Aberration-corrected STEM Observations on the Interfacial Structure and Strain Fields of Patterned SrRuO3 Artificial Atoms

Authors :: Vesna Srot
P. A. van Aken
Gennadii Laskin
Hans Boschker
Haobei Wang
Jochen Mannhart
Source :: Microscopy and Microanalysis. 25:964-965
Publication Year :: 2019
Publisher :: Oxford University Press (OUP), 2019.

Subjects :: Materials science
Strain (chemistry)
Instrumentation
Molecular physics

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