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Imaging of Materials through Aberration Corrected STEM

Authors :
M. F. Chisholm
Maria Varela
Y Peng
Gabriel M. Veith
Albina Y. Borisevich
Andrew R. Lupini
Nancy J. Dudney
K. van Benthem
S. J. Pennycook
Sergey N. Rashkeev
Source :
Microscopy and Microanalysis. 11
Publication Year :
2005
Publisher :
Oxford University Press (OUP), 2005.

Subjects

Subjects :
Instrumentation

Details

ISSN :
14358115 and 14319276
Volume :
11
Database :
OpenAIRE
Journal :
Microscopy and Microanalysis
Accession number :
edsair.doi...........acb520e68fe91d17246d0a76801414a8
Full Text :
https://doi.org/10.1017/s1431927605507268
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