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Thermal imprint into thin polymer layers below the critical molecular weight
- Source :
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 27:1191
- Publication Year :
- 2009
- Publisher :
- American Vacuum Society, 2009.
-
Abstract
- Imprints into thin thermoplastic layers in thermal imprint often go along with phenomena such as physical self-assembly and recovery, which impair the resulting replication quality. To avoid recovery, in particular within larger structures, a polymer with extremely low Mw (polystyrene with a molecular weight of 1kg∕mol) is investigated. In contrast to expectations, the polymer develops a strong recovery. This occurs at such low viscosities that the imprint is also impaired by strong physical self-assembly effects. The imprint is further hampered by the fact that, due to the very low glass-transition temperature, a layer preparation without prebake is required. In addition the suitable temperature window for imprint is extremely small (T≈40°C) so that process control is hardly feasible. Polystyrene with such low Mw is not suitable for thermal imprint.
- Subjects :
- chemistry.chemical_classification
Thermoplastic
Materials science
Nanotechnology
Polymer
Condensed Matter Physics
Soft lithography
chemistry.chemical_compound
Nanolithography
chemistry
Thermal
Polystyrene
Self-assembly
Electrical and Electronic Engineering
Composite material
Layer (electronics)
Subjects
Details
- ISSN :
- 10711023
- Volume :
- 27
- Database :
- OpenAIRE
- Journal :
- Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Accession number :
- edsair.doi...........ac5672e4dd007bac8029540bc9434e0e
- Full Text :
- https://doi.org/10.1116/1.3112630