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Developing High Resolution and High Precision Strain Mapping Methodologies for Materials Research and Semiconductor Technology
- Source :
- Microscopy and Microanalysis. 24:966-967
- Publication Year :
- 2018
- Publisher :
- Oxford University Press (OUP), 2018.
Details
- ISSN :
- 14358115 and 14319276
- Volume :
- 24
- Database :
- OpenAIRE
- Journal :
- Microscopy and Microanalysis
- Accession number :
- edsair.doi...........ac1aac62704b1e23750e77b0b4af5fae
- Full Text :
- https://doi.org/10.1017/s1431927618005329