The impact of extended defects on the generation and recombination lifetime in n type In.53Ga.47As

The relationship between the Threading Dislocation Density (TDD), the generation (τg) and recombination lifetime (τr) in relaxed n-type In.53Ga.47As is investigated for a series of p+n junction diodes, containing an TDD ranging from 105 to 1010 cm-2. The TDs are generated intentionally by lattice-misfit growth on Semi-Insulating (SI) InP and GaAs substrates. The lifetimes have been extracted from diode Current-Voltage (I-V) and Photoluminescence (PL) analysis showing that TDDs affect their values above a density of about 1×107 cm-2 (τg,E~0) and about 1×108 cm-2 (τr and τPL), which can be well-explained by the charged dislocation cylinder model. In addition, a detailed comparison between the results from Deep Level Transient Spectroscopy (DLTS) and from the diode characterization is performed, showing that the responsible G/R center shifts toward mid-gap in In.53Ga.47As and transfers from a native point defect (PD1) to a TD (E2/H1). Finally, the classical concept of generation lifetime and recombination lifetime in terms of dislocations is discussed based on the results.