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Freeform Surface Measurement from a Single Encoded Image Captured by a Camera with Varying Parameters

Authors :
Z.J. Liu
Rong Sheng Lu
X.M. Dang
P.H. Hu
Source :
Key Engineering Materials. :379-382
Publication Year :
2008
Publisher :
Trans Tech Publications, Ltd., 2008.

Abstract

In this paper, we present a method of measuring a freeform surface profile from a single image taken by a vision system consisting of a digital camera and a pattern projector. The measurement can be implemented without calibrating the camera’s parameters, provided that the intrinsic and extrinsic parameters of the projector are known. The method enables the camera to have much more adaptability for measuring a stationary or moving object with complex shape of surface.

Details

ISSN :
16629795
Database :
OpenAIRE
Journal :
Key Engineering Materials
Accession number :
edsair.doi...........ab17208fe78d7d6791ab1415e8cab492